Critical lines of semiconductor thin films — REE
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Theoretical and Computational Physics · nanoparticles nucleation surface interactions · Material Dynamics and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. Gabay · Phys. Rev. Lett. · 1981 · 47 · 20110.1103/PhysRevLett.47.201 ↗
2. De Almeida · J. Phys. A · 1978 · 11 · 98310.1088/0305-4470/11/5/028 ↗
3. Lefloch · Physica B · 1994 · 203 · 6310.1016/0921-4526(94)90278-X ↗
4. Lubecka · Phys. Rev. B · 1997 · 55 · 646010.1103/PhysRevB.55.6460 ↗
5. Pappa · J. Phys. C · 1984 · 17 · 130310.1088/0022-3719/17/7/022 ↗
6. de Courtenay · Phys. Rev. B · 1984 · 11 · 679110.1103/PhysRevB.30.6791 ↗
7. Kotliar · Phys. Rev. Lett. · 1984 · 53 · 175110.1103/PhysRevLett.53.1751 ↗