journal article·1998-01

Determination of the internal magnetic field from the A-T critical line in magnetic semiconductor thin films

M. Lubecka, L.J. Maksymowicz, R. Szymczak, W. PowroŹnika

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Abstract

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Research context

OpenAlex topics: Theoretical and Computational Physics · Complex Systems and Time Series Analysis · Magnetic properties of thin films

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References (8)

Show source-provided references
1. Gabay · Phys. Rev. Lett. · 1981 · 47 · 20110.1103/PhysRevLett.47.201 ↗
2. Campbell · Phys. Rev. Lett. · 1983 · 51 · 3710.1103/PhysRevLett.51.57 ↗
3. Pappa · J. Phys. C · 1984 · 17 · 130310.1088/0022-3719/17/7/022 ↗
4. L.J. Maksymowicz, M. Lubecka, R.Jabłoński, submitted to Phys. Rev. B.
5. Lubecka · Phys. Rev. B · 1993 · 48 · 95110.1103/PhysRevB.48.951 ↗
6. De Almeida · J. Phys. A · 1978 · 11 · 98310.1088/0305-4470/11/5/028 ↗
7. Lefloch · Physica B · 1994 · 203 · 6310.1016/0921-4526(94)90278-X ↗
8. Lubecka · Phys. Rev. B · 1997 · 55 · 646010.1103/PhysRevB.55.6460 ↗