Nanometer-scale characterization and manipulation of ferroelectric films using scanning probe microscopy

Abstract Ferroelectric domain structures in Pb(Ni 0.04 Zr 0.28 Ti 0.68 )O 3 and SrBi 2 Ta 2 O 9 ferroelectric thin films have been non-destructively observed using various scanning probe microscopy (SPM) modes. Using the SPM, it has been shown that it is possible to not only image but also manipulate the local domain structure on a nanometer scale by biasing the SPM tip. In addition, the SPM was applied to measure d C /d V – V spectra on individual ferroelectric grains. The examples illustrate the possibility of using an SPM-based datastorage read/write system.