Three-dimensional structural image of Zn0.4Mn0.6Te diluted magnetic semiconductor obtained by X-ray fluorescence holography

Abstract An X-ray fluorescence holography (XFH) measurement was performed at the beamline BL-3A in the Photon Factory to visualize the three-dimensional local atomic image around the Zn atoms in a diluted magnetic semiconductor Zn 0.4 Mn 0.6 Te. The nearest- and third-nearest-neighbor Te atoms were clearly visualized. The second-nearest-neighbor Zn or Mn atoms were, however, barely visible, although they could be seen in the reference ZnTe crystal. This result is similar to the previous Mn K α XFH data, and may suggest a rigid Te sublattice and a highly distorted cation sublattice, which contradicts a structural model for a similar diluted magnetic semiconductor Cd 1− x Mn x Te by Balzarotti et al.