Electrical Resistivity and Charge Density of Bismuth Telluride Doped with Erbium

The electric properties of a single crystal bismuth telluride doped with a small concentration of Erbium, $Bi_z-xEr_xTe_3$ with x = 0.002, are investigated as a function of temperature. The resistivity was obtained by using the van der Pauw method. The measured electrical resistivity is 78 ${\mu}{\Omega}cm$ at 4.2 K. The charge density of $Bi_z-xEr_xTe_3$ is found to be $2{\times}10¹⁹/cm^3$ at 4.2 K. It turns out that $Bi_z-xEr_xTe_3$ is a p-type semiconductor. It is discussed that the high mobility and less density support that $Bi_z-xEr_xTe_3$ is a potential sensor with high energy resolution. Comparison with an established material (i.e. Au:Er alloy) is also discussed.