Progress in the Imaging of Nanoscale Ferroelectric Domain via Scanning Force Microscope

Scanning force microscope (SFM) is paid great attention as a super-resolutional near-field scanning probe microscope in all circles. SFM is becoming a powerful technique with great potential for imaging and control of nanoscale domain structures in ferroelectric materials, and it is a promising technique well suited for nanoscale investigation of local properties including ferroelectricity, piezoelectricity, dielectricity in ferroelectics. This review is involved with the latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.