Study on Plasma Etching of β-Sic Thin Films Prepared by Epitaxial Grown on Si-Substrates in Different Etching Gases
Source abstract
Abstract
Plasma etching of β-SiC single crystal thin films produced via epitaxial growth on Si-substrates have been performed with different etching gases such as CF4, SF6, CF4+O2 and SF6+O2 mixtures. Experimental results indicate that when SF6+O2 mixture is used as etching gas, the etching rates of β-SiC films are higher than those of when CF4 +O2 is used as reactant gas. When SiC films are etched using SF6+O2 mixture, no dark layer which is residual SiC with a C-rich surface is formed under any gas mixing ratio used. However, there is a very slight discoloration in the sample surface when SiC is etched by using CF4+O2 mixture. which indicates that the sample surface being etched has a better smooth finish. Etching products using different etching gases are also compared discussed
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Silicon Carbide Semiconductor Technologies · Copper Interconnects and Reliability · Advanced ceramic materials synthesis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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