Study on the structure and X-ray diffraction pattern of orthorhombic BaSi_2
Source abstract
Abstract
A specific formula to calculate intensity of X-ray diffraction is deduced based on thomson scattering theory,and the XRD pattern of orthorhombic BaSi2is carried out,then the location,intensity and shape of peaks in the X-ray diffraction pattern have been studied.This method can be used to verify the reliability of XRD pattern in powder diffraction file database.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: X-ray Diffraction in Crystallography
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