Raman spectroscopy of In_2S_3:Ag thin films
Source abstract
Abstract
The characteristics of undoped and silver doped In2S3 films were studied via Raman spectroscopy,Xray diffraction and scanning electron microscope.The phase of In2S3 films was identified by XRD which showed the change of grain size after silver doped.As the films doped with silver,the red shift of Raman bands(232,272 and 300cm-1)of In2S3 films took place.The broadening of linewidths(FWHM)of some Raman bands indicated the exist of interstitial silver ions.The SEM pictures showed the growth pattern and the larger grain size of In2S3:Ag films.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films
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