journal article·2022-05Open access

Additive Manufacturing in Atomic Layer Processing Mode

Ivan Kundrata, Maïssa K. S. Barr, Sarah Tymek, Dirk Döhler, Boris Hudec, Philipp Brüner, Gabriel Vanko, Marian Precner, Tadahiro Yokosawa, Erdmann Spiecker, Maksym Plakhotnyuk, Karol Fröhlich, Julien Bachmann

Small Methods· Volume 6· Issue 5

Abstract

Abstract Additive manufacturing (3D printing) has not been applicable to micro‐ and nanoscale engineering due to the limited resolution. Atomic layer deposition (ALD) is a technique for coating large areas with atomic thickness resolution based on tailored surface chemical reactions. Thus, combining the principles of additive manufacturing with ALD could open up a completely new field of manufacturing. Indeed, it is shown that a spatially localized delivery of ALD precursors can generate materials patterns. In this “atomic‐layer additive manufacturing” (ALAM), the vertical resolution of the solid structure deposited is about 0.1 nm, whereas the lateral resolution is defined by the microfluidic gas delivery. The ALAM principle is demonstrated by generating lines and patterns of pure, crystalline TiO2 and Pt on planar substrates and conformal coatings of 3D nanostructures. The functional quality of ALAM patterns is exemplified with temperature sensors, which achieve a performance similar to the industry standard. This general method of multimaterial direct patterning is much simpler than standard multistep lithographic microfabrication. It offers process flexibility, saves processing time, investment, materials, waste, and energy. It is envisioned that together with etching, doping, and cleaning performed in a similar local manner, ALAM will create the “atomic‐layer advanced manufacturing” family of techniques.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Additive Manufacturing and 3D Printing Technologies · Semiconductor materials and devices · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

ATLANT 3D Nanosystems Kongens Lyngby 2800 Denmark

Friedrich‐Alexander‐Universität Erlangen‐Nürnberg Chemistry of Thin Film Materials IZNF 91058 Erlangen Germany

Institute of Electrical Engineering Slovak Academy of Sciences Bratislava 841 04 Slovakia

IONTOF GmbH 48149 Münster Germany

Friedrich‐Alexander University of Erlangen‐Nürnberg Chair of Micro‐ and Nanostructure Research (IMN) and Center for Nanoanalysis and Electron Microscopy (CENEM) IZNF 91058 Erlangen Germany

Center for Advanced Materials Application Slovak Academy of Sciences Bratislava 845 11 Slovakia

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