Correlative Chemical Imaging to Reveal the Nature of Different Commercial Graphene Materials (Small Methods 9/2026)
Source abstract
Abstract
Front Cover In article number e02344, Ievgen S. Donskyi, Vasile-Dan Hodoroaba, and co-workers present a straightforward correlative imaging approach for locating graphene flakes and impurities on the nanoscale within an ink as a highly complex matrix. A systematic comparison of different surface imaging methods demonstrates that the combination of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning electron microscopy (SEM) provides the most effective strategy for visualizing and identifying these features, helping to shed light in the dark.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ion-surface interactions and analysis · Nanopore and Nanochannel Transport Studies · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Federal Institute for Material Research and Testing (BAM), Division 6.1 Surface and Thin Film Analysis Berlin Germany
Department of Biology, Chemistry, and Pharmacy Freie Universität Berlin Berlin Germany
Department of Chemistry University of Turin Torino Italy
Graphenea S.A. San Sebastián Spain
Haydale Graphene Industries PLC Ammanford UK
References
Reference metadata was not supplied for this record.