Π-Shape Silicon Window for Controlling OFF-Current in Junctionless SOI MOSFET
Source abstract
Abstract
In this paper a modified junctionless transistor is proposed. The aim of the novel structure is controlling off-current using π-shape silicon window in the buried oxide under the source and the channel regions. The π-shape window changes the potential profile in the channel region in which the conduction band energy get away from the body Fermi energy and rebuild an electrostatic potential. Beside the significant reduced off-current, on current has acceptable value in the novel Silicon Region Junctionless MOSFET (SR-JMOSFET) than Conventional Junctionless MOSFET (C-JMOSFET). Moreover, replacing silicon material instead of silicon dioxide in the buried oxide causes reduced maximum temperature in the channel region. In this situation the heat could transfer to the π-shape silicon window and the temperature reduces in the active region, significantly. The simulation with the two-dimensional ATLAS simulator shows that short channel effects such as subthreshold and DIBL are controlled effectively in the SR-JMOSFET. Also, the optimum values of length and thickness of the π-shape window are defined to obtain the best behavior of the device.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Silicon Carbide Semiconductor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
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