journal article·2020-07-01Open access

Low frequency noise in reverse biased double heterostructure P-InAsSbP/n-InAs infrared photodiodes

N Dyakonova, S A Karandashev, M E Levinshtein, B A Matveev, M A Remennyi

Abstract

Low frequency reverse current noise is studied for the first time in InAsSbP/InAs double heterostructure (DH) photodiodes in the frequency range 1 Hz–10 4 Hz at 300 K and 100 K. At room temperature, the noise in the DH photodiodes is 1/ f and might be significantly lower (by ∼17 dB) than in single heterostructure InAsSbP/InAs photodiodes. In the practically most important regime of low reverse currents, I rb , the current dependence of spectral noise density is proportional to I r b 2 , both at 300 K and 100 K. The reverse current noise might provide the limit for the detectivity of DH photodiodes at I rb > 3 × 10 −6 A at 300 K and I rb > 8 × 10 −9 A at 100 K.
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Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Thermography and Photoacoustic Techniques

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