Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs

C H Ling; G S Samudra; B P Seah

doi:10.1088/0268-1242/10/12/016

journal article·1995-12-01

Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs

C H Ling, G S Samudra, B P Seah

Semiconductor Science and Technology· Volume 10· Issue 12

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Abstract

10.1088/0268-1242/10/12/016

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Ferroelectric and Negative Capacitance Devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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