Correlation of atomic force microscopy detecting local conductivity and micro‐Raman spectroscopy on polymer–fullerene composite films

Abstract Thin hetero‐junction composite films of polymer (electron donor) and fullerene (electron acceptor) are prepared on indium‐tin‐oxide coated glass by spin‐coating from solution in dichlorobenzene. Optimized atomic force microscopy (AFM) parameters allowed us to scan these soft composite films in contact mode and to measure their local conductivity with high lateral resolution by current‐sensing AFM. The morphology and local conductivity data are correlated with Kelvin force microscopy and micro‐Raman mapping and discussed with view to their photovoltaic properties. Regions with both compounds present are compared to areas where the components segregated, acting as shunts of the junction. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)