Source abstract
Abstract
Silicon nanowire field‐effect transistors (SiNW‐FETs) are offering a label‐free sensing of DNA molecules based on the detection of the biomolecules’ charges. Typically, the charge accumulation at the solid–liquid interface is leading to a change in surface potential of the device. In other works, this effect is usually displayed as change in conductance of the nanowires. In this paper, we show that our topdown processed SiNW‐FET devices can be regarded as long‐channel, ion‐sensitive field‐effect transistor devices (ISFETs) and that their electronic characteristics can be fitted by an advanced MOSFET model taking narrow channel effects into account. In DNA experiments, changes in threshold voltage upon immobilization of capture DNA and hybridization with complementary target DNA were recorded as reported before. The signal amplitudes were scaling with different concentrations of electrolyte buffer as known from the commonly used Poisson–Boltzmann theory. In reports from other groups, the sensitivity of SiNW‐FETs was reported to be superior compared to ISFETs and scaling effects were observed with smaller wires having higher sensitivities. From our experiments, it seems that the immobilization of the DNA to the wire structure is leading to two effects: firstly, the threshold voltage is changing, leading to a shift in the transistors’ transfer characteristics similar to what was described for ISFET devices. In addition, upon DNA binding, a general increase in charge carrier density inside the nanowire is leading to an enhanced conductance. We assume that the latter effect is scaling with nanowire dimensions, while the surface effect is typically constant for all sensor structures.
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Research context
OpenAlex topics: Nanowire Synthesis and Applications · Analytical Chemistry and Sensors · Advancements in Semiconductor Devices and Circuit Design
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Informatics and Microsystem Technology University of Applied Sciences Kaiserslautern Amerikastr. 1 66482 Zweibrücken Germany
RAM Group DE GmbH Research Development Center Amerikastr. 15 66482 Zweibrücken Germany
Department of Physics RWTH Aachen University Sommerfeldstr. 14 52074 Aachen Germany
Department of Physics and Astronomy Catholic University Leuven Celestijnenlaan 200d 3001 Leuven Belgium
Institute for Materials Research Hasselt University Agoralaan Building D 3590 Diepenbeek Belgium
Funding
Federal Ministry of Education and Research
References (55)
Show source-provided references
46. Antognetti P. · 1993
48. Jeng M.‐C. · 1990