Investigation on the Adhesion of Polymer Particles to the Surface of a Semiconductor

Abstract In this work the role of electrostatic forces in the adhesion of particles of dielectrics to a solid surface was studied. The experiment consisted in measuring simultaneously the force of adhesion and the charges of the electric double layer arising upon contact. The measurements were made with specially developed units—a pneumatic adhesiometer and a charge-spectrometer. The objects of study were polymer powders used in electrography, whose adhesion to thin layers of selenium samples were varied by varying the illumination and were estimated by their volume resistance in the dark and in the light. The shift in the Fermi level of the selenium caused by the change in the output work is accompanied by a change in adhesion of the particles. Experiments on the separation of polymer particles and films from selenium surface on illumination revealed spectral dependence of adhesion. In accordance with the electronic theory of adhesion, the effects observed may be attributed to the change in charge density of the electric double layer.