Nanohardness and Young’s modulus of II-IV-V 2 chalcopyrite nonlinear optical crystals: a comparative study
Source abstract
Abstract
Nanohardness and Young’s modulus of oriented monocrystalline II-IV-V 2 chalcopyrite semiconductors are measured by nanoindentation for the first time. The tests are performed on (100) and (001) surfaces. Anisotropy is observed for Young’s modulus only. It is most pronounced for CdSiP 2 . The hardness results display linear dependence on the melting temperature (except for CdSiP 2 ) and the values decrease with the molar mass. They can be well fitted as a function of the molar mass and the unit cell volume. Young’s modulus dependences show similar trends.
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Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Quantum Dots Synthesis And Properties · Copper-based nanomaterials and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Plovdiv University Paisii Hilendarski
BAE Systems
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