Recent advances on physico-chemical characterization of passive films by EIS and differential admittance techniques
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Abstract
Abstract Thin Nb2O5 anodic films (∼20 nm thick) grown in phosphoric acid solution have been characterised by EIS and differential admittance study in a large range of potential and frequency. The overall electrical behaviour has been interpreted by means of the theory of amorphous semiconductor Schottky barrier in presence of a non-constant density of states (DOS). A comparison of DOS for films grown in different electrolytes is reported.
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Research context
OpenAlex topics: Semiconductor materials and interfaces · Semiconductor materials and devices · Concrete Corrosion and Durability
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References (11)
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1. Di Quarto · Corrosion Eng. Sci. Technol. · 2004 · 39 · 7110.1179/147842204225016903 ↗
2. Di Quarto · Electrochim Acta · 1990 · 35 · 9910.1016/0013-4686(90)85045-O ↗
3. Di Quarto · Electrochim Acta · 2005 · 50 · 509010.1016/j.electacta.2005.03.065 ↗
4. S. Ono, M. Baba, M. Shimiyama, H. Asoh, ECS PV 2003-25, V. Birss, L. Burke, A.R. Hillman, R.S. Lillard (Eds.), 2004, pp. 133–142.
5. Habazaki · Electrochim Acta · 2005 · 50 · 533410.1016/j.electacta.2005.03.011 ↗
6. Cohen · Phys. Rev. B · 1982 · 25 · 532110.1103/PhysRevB.25.5321 ↗
7. Archibald · Phil. Mag. B · 1986 · 54 · 42110.1080/13642818608236858 ↗
8. Archibald · Phil. Mag. B · 1987 · 56 · 42910.1080/13642818708221329 ↗
9. Olsson · J. Electrochem. Soc. · 2004 · 151 · B65210.1149/1.1819896 ↗
10. F. Di Quarto, F. La Mantia, M. Santamaria, in preparation.
11. M.J. Dignam, Oxides and Oxide Films, Marcel Dekker, Inc., New York, 1 1972, pp. 91–286.