journal article·2022-03-24Open access

Effect of Annealing Temperature on the Microstructure and Optical Properties of Lanthanum-Doped Hafnium Oxide

Xiangduo Cui, Kamale Tuokedaerhan, Haotian Cai, Zhenchuan Lu

Coatings· Volume 12· Issue 4

Abstract

Lanthanum-doped HfO2 films were deposited on Si by sol–gel technology. The effects of annealing temperature on the optical properties, interface chemistry, and energy band structure of Lanthanum-doped HfO2 films have been investigated. The crystallinity and surface morphologies of the films are strongly dependent on the annealing temperature. X-ray diffraction (XRD) analysis showed a monoclinic phase, and there was a tendency to preferentially grow with increasing temperature. The calculated grain sizes ranged from 17.1 to 22.4 nm on average. It was also confirmed from Raman spectroscopy that increasing the annealing temperature can improve the crystallinity of the films. The surface of the film was smooth, and the film had good interfacial contact with the silicon substrate. The band gap increased from 5.53 to 5.91 eV with increasing annealing temperature. The calculated conduction band offset and valence band offset both exceeded 1 eV. In conclusion, smaller grain size, good crystallinity and interfacial contact can be obtained by adjusting the annealing temperature. Higher conduction band and valence band offsets can meet the minimum barrier height requirements of complementary metal oxide semiconductors (CMOS) and have potential applications.
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Research context

OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Ferroelectric and Negative Capacitance Devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Xinjiang Key Laboratory of Solid State Physics and Devices, Xinjiang University, Urumqi 830046, China

School of Physics Science and Technology, Xinjiang University, Urumqi 830046, China

Funding

National Natural Science Foundation of China · Natural Science Foundation of Xinjiang Uygur Autonomous Region · Tianshan Innovation Team Program of Xinjiang Uygur Autonomous Region

References (46)

Show source-provided references
1. Impact of incorporated oxygen quantity on optical, structural and dielectric properties of reactive magnetron sputter grown high-κ HfO2/Hf/Si thin film10.1016/j.apsusc.2014.03.077 ↗
2. The interface reaction of high-k La2Hf2O7/Si thin film grown by pulsed laser deposition10.1016/j.apsusc.2009.08.070 ↗
3. Defect energy levels in HfO2 high-dielectric-constant gate oxide10.1063/1.2119425 ↗
4. Germanium nanowire field-effect transistors with SiO2 and high-κ HfO2 gate dielectrics10.1063/1.1611644 ↗
5. Dielectric properties of dysprosium- and scandium-doped hafnium dioxide thin films10.1063/1.2798498 ↗
6. High-κ gate dielectrics: Current status and materials properties considerations10.1063/1.1361065 ↗
7. Oxynitridization Dependent Interface Control and Band Alignment of AlON/SiON/Si Gate Stacks Grown by Metalorganic Chemical Vapor Deposition10.1166/sam.2013.1491 ↗
8. Effect of deuterium postmetal annealing on the reliability characteristics of an atomic-layer-deposited HfO2/SiO2 stack gate dielectrics10.1063/1.1523636 ↗
9. Electrical characteristics of a Dy-doped HfO2 gate dielectric10.1063/1.1409945 ↗
10. The structural and interfacial properties of HfO2/Si by the plasma oxidation of sputtered metallic Hf thin films10.1016/j.jcrysgro.2004.05.038 ↗
11. Sub-0.5 nm Equivalent Oxide Thickness Scaling for Si-Doped Zr1−xHfxO2 Thin Film without Using Noble Metal Electrode10.1021/acsami.5b04303 ↗
12. Characterization of Hf1−xZrxO2 Gate Dielectrics with 0≤ x ≤ 1 Prepared by Atomic Layer Deposition for Metal Oxide Semiconductor Field Effect Transistor Applications10.1143/JJAP.51.011101 ↗
13. Influence of rapid thermal annealing temperature on structure and electrical properties of high permittivity HfTiO thin film used in MOSFET10.1016/j.microrel.2013.10.014 ↗
14. Modulation of the microstructure, optical, and electrical properties of HfYO gate dielectrics by annealing temperature10.1016/j.jallcom.2017.11.261 ↗
15. Effects of rapid thermal annealing on interfacial and electrical properties of Gd-doped HfO2 high-k gate dielectrics10.1016/j.jallcom.2015.06.039 ↗
16. Regulating crystal structure and ferroelectricity in Sr doped HfO2 thin films fabricated by metallo-organic decomposition10.1016/j.ceramint.2018.10.214 ↗
17. Atomic-scale depth profiling of composition, chemical structure and electronic band structure of La2O3/Si(100) interfacial transition layer10.1016/j.apsusc.2004.05.032 ↗
18. Ferroelectric and pyroelectric properties of polycrystalline La-doped HfO2 thin films10.1063/1.5089821 ↗
19. Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material10.1021/acs.inorgchem.7b03149 ↗
20. Cobalt (II) β-diketonate adducts as new precursors for the growth of cobalt oxide films by liquid injection MOCVD10.1016/j.jcrysgro.2003.10.077 ↗
21. Low interfacial trap density and sub-nm equivalent oxide thickness in In0.53Ga0.47As (001) metal-oxide-semiconductor devices using molecular beam deposited HfO2/Al2O3 as gate dielectrics10.1063/1.3617436 ↗
22. White light generation from HfO2 films co-doped with Eu3++ Tb3+ ions synthesized by pulsed laser ablation technique10.1016/j.ceramint.2016.09.163 ↗
23. Impact of oxygen vacancy on the ferroelectric properties of lanthanum-doped hafnium oxide10.1063/5.0023554 ↗
24. Structure evolution, bandgap, and dielectric function in La-doped hafnium oxide thin layer subjected to swift Xe ion irradiation10.1063/5.0025536 ↗
25. Interfacial structure and electrical properties of ultrathin HfO2 dielectric films on Si substrates by surface sol-gel method10.1088/0022-3727/42/1/015405 ↗
26. Microstructure, optical, electrical properties, and leakage current transport mechanism of sol-gel-processed high-k HfO2 gate dielectrics10.1016/j.ceramint.2016.01.050 ↗
27. Production of HfO2 thin films using different methods: Chemical bath deposition, SILAR and sol-gel process10.1007/s12613-014-0978-6 ↗
28. Hafnia sol-gel films synthesized from HfCl4: Changes of structure and properties with the firing temperature10.1007/s10971-006-1511-9 ↗
29. Metal nanocrystal memory with sol–gel derived HfO2 high-κ tunnel oxide10.1016/j.tsf.2011.02.086 ↗
30. Photonic curing of sol-gel derived HfO2 dielectrics for organic field-effect transistors10.1016/j.ceramint.2014.07.099 ↗
31. Preparation of hafnium oxide thin films by sol-gel method10.1007/s10832-007-9228-x ↗
32. The effect of post-process annealing on optical and electrical properties of mixed HfO2-TiO2 thin film coatings10.1007/s10854-019-00938-5 ↗
33. Microstructure-Mechanical Property Correlation in Size Controlled Nanocrystalline Molybdenum Films10.1002/adem.201800496 ↗
34. Fabrication, characterization and optimization of high conductivity and high quality nanocrystalline molybdenum thin films10.1016/j.jmst.2019.05.023 ↗
35. Oxygen vacancy induced structure change and interface reaction in HfO2 films on native SiO2/Si substrate10.1016/j.apsusc.2016.08.051 ↗
36. Boosting Electrical Performance of High-κ Nanomultilayer Dielectrics and Electronic Devices by Combining Solution Combustion Synthesis and UV Irradiation10.1021/acsami.7b11752 ↗
37. Wet oxidation growth of hafnium doped tantalum oxide films with different composition deposited on silicon substrate10.1016/j.apsusc.2020.146722 ↗
38. First-principles study of structural, vibrational, and lattice dielectric properties of hafnium oxide10.1103/PhysRevB.65.233106 ↗
39. Structure and optical properties of HfO2 thin films on silicon after rapid thermal annealing10.1016/j.optmat.2009.10.003 ↗
40. Aqueous-solution-driven HfGdO gate dielectrics for low-voltage-operated α-InGaZnO transistors and inverter circuits10.1016/j.jmst.2020.03.007 ↗
41. Effects of the ratio of O2/Ar pressure on wettability and optical properties of HfO2 films before and after doping with Al10.1016/j.apsusc.2016.01.122 ↗
42. Low-temperature fabrication of solution-processed hafnium oxide gate insulator films using a thermally purified solution process10.1039/C8TC00899J ↗
43. Band structure and electrical properties of Gd-doped HfO2 high k gate dielectric10.1063/1.3460277 ↗
44. Controlled optical properties via chemical composition tuning in molybdenum-incorporated beta-Ga2O3 nanocrystalline films10.1016/j.cplett.2017.06.063 ↗
45. Structure, Morphology, and Optical Properties of Amorphous and Nanocrystalline Gallium Oxide Thin Films10.1021/jp311300e ↗
46. Solution-processed HfGdO gate dielectric thin films for CMOS application: Effect of annealing temperature10.1016/j.jallcom.2017.10.019 ↗