journal article·2023-10-10

Investigating Strain between Phase-Segregated Domains in Cu-Deficient CuInP2S6

Rahul Rao, Ryan Selhorst, Jie Jiang, Benjamin S. Conner, Ryan Siebenaller, Emmanuel Rowe, Andrea N. Giordano, Ruth Pachter, Michael A. Susner

Chemistry of Materials· Volume 35· Issue 19
Publisher page

Abstract

CuInP 2 S 6 (CIPS) is an emerging layered ferroelectric material with a Curie temperature above room temperature. When synthesized with Cu deficiencies (i.e., Cu 1– x In 1+ x /3 P 2 S 6 ), the material segregates into CIPS and In 4/3 P 2 S 6 (IPS) self-assembled heterostructures within the same single crystal. This segregation results in significant in-plane and out-of-plane strains between the CIPS and IPS phases as the volume fraction of the CIPS (IPS) domains shrinks (grows) with a decreasing Cu fraction. Here, we synthesized CIPS with varying amounts of Cu ( x = 0, 0.2, 0.3, 0.4, 0.5, 0.7, 0.8, and 1) and measured the strains between the CIPS and IPS phases through the evolution of the respective Raman, infrared, and optical reflectance spectra. Density functional theory calculations revealed vibrational modes that are unique to the CIPS and IPS phases, which can be used to distinguish between the two phases through two-dimensional Raman mapping. A comparison of the composition-dependent frequencies and intensities of the CIPS and IPS Raman peaks showed interesting trends with a decreasing CIPS phase fraction (i.e., Cu/In ratio). Our data reveal red- and blue-shifted Raman and infrared peak frequencies that we correlate to lattice strains arising from the segregation of the material into CIPS and IPS chemical domains. The strain is highest for a Cu/In ratio of 0.33 (Cu 0.4 In 1.2 P 2 S 6 ), which we attribute to the equal and opposite strains that the CIPS and IPS phases exert on each other. In addition, the bandgaps we extracted from the optical reflectance spectra revealed a decrease in values, with Cu 0.4 In 1.2 P 2 S 6 having the lowest value of ∼2.3 eV.
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Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Chalcogenide Semiconductor Thin Films · Solid-state spectroscopy and crystallography

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, United States

UES, Inc., Dayton, Ohio 45433, United States

Sensors Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, United States

National Research Council, Washington, D.C. 20001, United States

Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, United States

Department of Engineering Technology, Middle Tennessee State University, Murfreesboro, Tennessee 37132, United States

Department of Astronomy and Physics, Vanderbilt University, Nashville, Tennessee 37235, United States

Department of Life and Physical Sciences, Fisk University, Nashville, Tennessee 37208, United States

Funding

Air Force Office of Scientific Research · National Academies of Sciences, Engineering, and Medicine · Ministry of Science and Technology, Taiwan · Asian Office of Aerospace Research and Development

References (50)

Show source-provided references
1. 10.1126/sciadv.aav378010.1126/sciadv.aav3780 ↗
2. 10.1021/acsnano.9b0149110.1021/acsnano.9b01491 ↗
3. 10.1103/PhysRevMaterials.3.02440110.1103/PhysRevMaterials.3.024401 ↗
4. 10.1021/acs.nanolett.2c0013010.1021/acs.nanolett.2c00130 ↗
5. 10.1126/sciadv.abq123210.1126/sciadv.abq1232 ↗
6. 10.1021/acsnano.5b0568210.1021/acsnano.5b05682 ↗
7. 10.1021/acsnano.7b0269510.1021/acsnano.7b02695 ↗
8. 10.1038/s41563-019-0532-z10.1038/s41563-019-0532-z ↗
9. 10.1016/j.mtcomm.2023.10584010.1016/j.mtcomm.2023.105840 ↗
10. 10.1021/acs.jpclett.2c0296510.1021/acs.jpclett.2c02965 ↗
11. 10.1021/acsnano.2c0699210.1021/acsnano.2c06992 ↗
12. 10.1021/acs.inorgchem.0c0357710.1021/acs.inorgchem.0c03577 ↗
13. 10.1021/acsnano.5b0581810.1021/acsnano.5b05818 ↗
14. 10.1016/j.physb.2004.03.19210.1016/j.physb.2004.03.192 ↗
15. 10.1021/cm504242t10.1021/cm504242t ↗
16. 10.1103/PhysRevMaterials.4.10400310.1103/PhysRevMaterials.4.104003 ↗
17. Kubelka P. · Z. Technol. Phys. · 1931 · 12 · 593
18. 10.1016/0927-0256(96)00008-010.1016/0927-0256(96)00008-0 ↗
19. 10.1103/PhysRevB.59.175810.1103/PhysRevB.59.1758 ↗
20. 10.1016/0925-8388(94)01416-710.1016/0925-8388(94)01416-7 ↗
21. 10.1103/PhysRevLett.77.386510.1103/PhysRevLett.77.3865 ↗
22. 10.1063/1.338234410.1063/1.3382344 ↗
23. 10.1021/acs.chemmater.1c0251410.1021/acs.chemmater.1c02514 ↗
24. 10.1103/PhysRevB.105.07515110.1103/PhysRevB.105.075151 ↗
25. 10.1016/j.scriptamat.2015.07.02110.1016/j.scriptamat.2015.07.021 ↗
26. 10.1039/C7CP01680H10.1039/C7CP01680H ↗
27. 10.1103/PhysRevB.56.1086010.1103/PhysRevB.56.10860 ↗
28. 10.1107/S056774087800500210.1107/S0567740878005002 ↗
29. 10.1103/PhysRevB.58.911910.1103/PhysRevB.58.9119 ↗
30. 10.1063/1.512590910.1063/1.5125909 ↗
31. 10.1039/C7RA13519J10.1039/C7RA13519J ↗
32. 10.1088/0953-8984/15/37/00610.1088/0953-8984/15/37/006 ↗
33. 10.1103/PhysRevB.61.1505110.1103/PhysRevB.61.15051 ↗
34. 10.1103/PhysRevB.104.23542110.1103/PhysRevB.104.235421 ↗
35. 10.1103/PhysRevMaterials.6.04500110.1103/PhysRevMaterials.6.045001 ↗
36. 10.1016/0022-4596(85)90305-610.1016/0022-4596(85)90305-6 ↗
37. 10.1016/0167-2738(83)90276-X10.1016/0167-2738(83)90276-X ↗
38. 10.1016/0022-4596(88)90030-810.1016/0022-4596(88)90030-8 ↗
39. 10.1016/0022-4596(83)90107-X10.1016/0022-4596(83)90107-X ↗
40. 10.1103/PhysRevB.38.1208910.1103/PhysRevB.38.12089 ↗
41. 10.1063/5.009576010.1063/5.0095760 ↗
42. 10.1021/acsami.0c0924610.1021/acsami.0c09246 ↗
43. Nye J. F. · 1985
44. 10.1002/pssb.20030151310.1002/pssb.200301513 ↗
45. 10.1016/j.flatc.2021.10029010.1016/j.flatc.2021.100290 ↗
46. 10.1103/PhysRevB.107.16512510.1103/PhysRevB.107.165125 ↗
47. 10.1080/00150193.2015.106135810.1080/00150193.2015.1061358 ↗
48. 10.1039/C9MH01215J10.1039/C9MH01215J ↗
49. 10.48550/arXiv.2306.0871410.48550/arXiv.2306.08714 ↗
50. 10.1021/acsnano.3c0240610.1021/acsnano.3c02406 ↗