A Molybdenum Dithiolene Complex asp-Dopant for Hole-Transport Materials: A Multitechnique Experimental and Theoretical Investigation
Source abstract
Abstract
Molybdenum tris-[1,2-bis(trifluoromethyl)ethane-1,2-dithiolene] (Mo(tfd) 3 ) is investigated as a p -dopant for organic semiconductors. With an electron affinity of 5.6 eV, Mo(tfd) 3 is a strong oxidizing agent suitable for the oxidation of several hole transport materials (HTMs). Ultraviolet photoemission spectroscopy confirms p -doping of the standard HTM N, N′ -di-[(1-naphthyl)- N, N′ -diphenyl]-1,1′-biphenyl-4,4′-diamine (α-NPD). Strong enhancement of hole injection at α-NPD/Au interfaces is achieved via doping-induced formation of a narrow depletion region in the organic semiconductor. Variable-temperature current−voltage measurements on α-NPD: Mo(tfd) 3 (0−3.8 mol %) yield an activation energy for polaron transport that decreases with increasing doping concentration, which is consistent with the effect of the doping-induced filling of traps on hopping transport. Good stability of Mo(tfd) 3 versus diffusion in the α-NPD host matrix is demonstrated by Rutherford backscattering for temperatures up to 110 °C. Density functional theory (DFT) calculations are performed to obtain geometries and electronic structures of isolated neutral and anionic Mo(tfd) 3 molecules.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Molecular Junctions and Nanostructures · Advancements in Semiconductor Devices and Circuit Design
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544
School of Chemistry and Biochemistry and Center for Organic Electronics and Photonics, Georgia Institute of Technology, Atlanta, Georgia 30332
Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854
Institute for Advanced Materials Devices and Nanotechnology, Rutgers University, Piscataway, New Jersey 08854
References (48)
Show source-provided references
1. Lous E. · Phys. Rev. B · 1995 · 51 · 1725110.1103/PhysRevB.51.17251 ↗
2. Gao W. Y. · J. Appl. Phys. · 2003 · 94 · 35910.1063/1.1577400 ↗
3. Abe Y. · Appl. Phys. Lett. · 2005 · 87 · 15350610.1063/1.2099540 ↗
4. Chan C. K. · J. Appl. Phys. · 2007 · 102 · 01490610.1063/1.2752145 ↗
5. Porter W. W. · J. Mater. Chem. · 2007 · 17 · 46910.1039/B610806G ↗
6. Kröger M. · Org. Electron. · 2009 · 10 · 93210.1016/j.orgel.2009.05.007 ↗
7. Walzer K. · Chem. Rev. · 2007 · 107 · 123310.1021/cr050156n ↗
8. Gao W. Y. · J. Phys. Condens. Matter · 2003 · 15 · S275710.1088/0953-8984/15/38/014 ↗
9. Anthopoulos T. D. · Appl. Phys. Lett. · 2003 · 82 · 162810.1063/1.1559649 ↗
10. Lu C.-K. · Phys. Rev. B · 2007 · 75 · 23520610.1103/PhysRevB.75.235206 ↗
11. Xie G. · Appl. Phys. Lett. · 2008 · 92 · 09330510.1063/1.2890490 ↗
12. Vanoni C. · Appl. Phys. Lett. · 2007 · 90 · 19311910.1063/1.2738382 ↗
13. Yim K.-H. · Adv. Mater. · 2008 · 20 · 331910.1002/adma.200800735 ↗
14. Kröger M. · Appl. Phys. Lett. · 2009 · 95 · 12330110.1063/1.3231928 ↗
15. Drechsel J. · Synth. Met. · 2002 · 127 · 20110.1016/S0379-6779(01)00623-3 ↗
16. Wellmann P. · Inf. Disp. · 2005 · 13 · 39310.1889/1.1927730 ↗
17. Gao Z. Q. · Chem. Commun. · 2008 · 11710.1039/B713566A ↗
18. King R. B. · Inorg. Chem. · 1963 · 2 · 64110.1021/ic50007a056 ↗
19. Connelly N. · Chem. Rev. · 1996 · 96 · 87710.1021/cr940053x ↗
20. Qi Y. · J. Am. Chem. Soc. · 2009 · 131 · 1253010.1021/ja904939g ↗
21. Zeika, O.; Werner, A.; Hartmann, H.; Willmann, S.PCT Application WO 061517, 2008.
22. Krespan N. G. · J. Am. Chem. Soc. · 1961 · 83 · 343410.1021/ja01477a020 ↗
23. Davison A. · Inorg. Synth. · 1967 · 10 · 810.1002/9780470132418.ch3 ↗
24. Wu C. I. · Chem. Phys. Lett. · 1997 · 272 · 4310.1016/S0009-2614(97)00481-8 ↗
25. Mayer M. · AIP Conf. Proc. · 1999 · 475 · 54110.1063/1.59188 ↗
26. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Montgomery, J. A., Jr.; Vreven, T.; Kudin, K. N.; Burant, J. C.; Millam, J. M.; Iyengar, S. S.; Tomasi, J.; Barone, V.; Mennucci, B.; Cossi, M.; Scalmani, G.; Rega, N.; Petersson, G. A.; Nakatsuji, H.; Hada, M.; Ehara, M.; Toyota, K.; Fukuda, R.; Hasegawa, J.; Ishida, M.; Nakajima, T.; Honda, Y.; Kitao, O.; Nakai, H.; Klene, M.; Li, X.; Knox, J. E.; Hratchian, H. P.; Cross, J. B.; Bakken, V.; Adamo, C.; Jaramillo, J.; Gomperts, R.; Stratmann, R. E.; Yazyev, O.; Austin, A. J.; Cammi, R.; Pomelli, C.; Ochterski, J. W.; Ayala, P. Y.; Morokuma, K.; Voth, G. A.; Salvador, P.; Dannenberg, J. J.; Zakrzewski, V. G.; Dapprich, S.; Daniels, A. D.; Strain, M. C.; Farkas, O.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Ortiz, J. V.; Cui, Q.; Baboul, A. G.; Clifford, S.; Cioslowski, J.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Gonzalez, C.; Pople, J. A.Gaussian 03, Revision C.02;Gaussian, Inc.:Wallingford, CT, 2004.
27. Burgmayer S. · Inorg. Chem. · 1999 · 38 · 260710.1021/ic9808807 ↗
28. Turner N. H. · Surf. Interface Anal. · 1990 · 15 · 21510.1002/sia.740150305 ↗
29. Stiefel E. I. · J. Am. Chem. Soc. · 1966 · 88 · 295610.1021/ja00965a015 ↗
30. Davison A. · J. Am. Chem. Soc. · 1964 · 86 · 279910.1021/ja01068a010 ↗
31. Tenderholt A. · Inorg. Chem. · 2008 · 47 · 638210.1021/ic800494h ↗
32. Kapre R. · Inorg. Chem. · 2007 · 46 · 564210.1021/ic700600r ↗
33. Hwang J. · J. Phys. Chem. C · 2006 · 111 · 137810.1021/jp067004w ↗
34. Tengstedt C. · Appl. Phys. Lett. · 2006 · 88 · 05350210.1063/1.2168515 ↗
35. Hwang J. · Mater. Sci. Eng., R.: Rep. · 2009 · 64 · 110.1016/j.mser.2008.12.001 ↗
36. Hill I. G. · Chem. Phys. Lett. · 2000 · 317 · 44410.1016/S0009-2614(99)01384-6 ↗
37. Hill I. G. · Chem. Phys. Lett. · 2000 · 327 · 18110.1016/S0009-2614(00)00882-4 ↗
38. Murphy E. L. · Phys. Rev. · 1956 · 102 · 146410.1103/PhysRev.102.1464 ↗
39. Hermann S. · Phys. Status Solidi C · 2005 · 2 · 403710.1002/pssc.200562211 ↗
40. Gao W. · Org. Electron. · 2002 · 3 · 5310.1016/S1566-1199(02)00033-2 ↗
41. Pope M. · 1998
42. Brütting W. · J. Appl. Phys. · 2001 · 89 · 170410.1063/1.1332088 ↗
43. Wan A. · Org. Electron. · 2005 · 6 · 4710.1016/j.orgel.2005.02.003 ↗
44. Vissenberg M. C. J. M. · Phys. Rev. B · 1998 · 57 · 1296410.1103/PhysRevB.57.12964 ↗
45. Wang K. · Inorg. Chem. · 1999 · 38 · 433410.1021/ic990204k ↗
46. Heuer W. B. · Chem. Mater. · 1990 · 2 · 76410.1021/cm00012a032 ↗
47. Campbell S. · Inorg. Chem. · 1996 · 32 · 328510.1021/ic9513907 ↗
48. Kaupp M. · Angew. Chem., Int. Ed. · 1995 · 34 · 98610.1002/anie.199509861 ↗