Efficient High Area OFETs by Solution Based Processing of a π-Electron Rich Donor
Source abstract
Abstract
We report on the preparation of high performance field-effect transistors (FETs) based on large areas of aligned films of a TTF derivative, namely, tetrakis-(octadecylthio)-tetrathiafulvalene (TTF-4SC18). TTF-4SC18 assembles into one-dimensional stacks in which the long alkyl chains promote intermolecular π−π overlapping due to their extremely closely packed nature. The films were prepared from solution by zone-casting, a simple technique that does not require the use of preoriented substrates. The films were characterized by AFM and X-ray, indicating an extremely high crystalline quality. The TTF molecules are tilted with respect to the substrate surface and are well-aligned in the casting direction. More than 40 FETs were measured, showing a remarkable reproducibility of their performance. The average charge carrier mobility value measured along the casting direction was about 0.006 cm 2 /V s for a channel length L = 100 μm and about 0.01 cm 2 /V s for L = 80 μm and L = 50 μm. The FET mobilities determined in the direction perpendicular to the orientation were ca. 1 order of magnitude lower. We found that all the devices after annealing exhibited an enhanced performance with FETs mobilities about 1 order of magnitude higher. The best devices revealed a charge carrier mobility close to 0.1 cm 2 /V s with an on/off ratio of the order of 10 4 .
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Organic and Molecular Conductors Research · Organic Electronics and Photovoltaics · Perovskite Materials and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Molecular Physics, Technical University of Lodz, 90-924 Lodz, Poland, Institut de Ciència de Materials de Barcelona (CSIC), Campus Universitari de Bellaterra, 08193 Cerdanyola del Vallès, Spain, and European Synchrotron Radiation Facility, ESRF BP 220 F-38043, Grenoble Cedex, France
References (38)
Show source-provided references
1. Sun Y. M. · J. Mater. Chem. · 2005 · 15 · 5310.1039/b411245h ↗
2. Dimitrakopoulos C. D. · Adv. Mater. · 2002 · 14 · 9910.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO;2-9 ↗
3. Dimitrakopoulos C. D. · Science · 1999 · 283 · 82210.1126/science.283.5403.822 ↗
4. Afzali A. · J. Am. Chem. Soc. · 2002 · 124 · 881210.1021/ja0266621 ↗
5. Murphy A. R. · J. Am. Chem. Soc. · 2004 · 126 · 159610.1021/ja039529x ↗
6. Herwig P. T. · Adv. Mater. · 1999 · 11 · 48010.1002/(SICI)1521-4095(199904)11:6<480::AID-ADMA480>3.0.CO;2-U ↗
7. Gelink G. H. · Nat. Mater. · 2004 · 3 · 10610.1038/nmat1061 ↗
8. Nagamatsu S. · Macromolecules · 2003 · 36 · 525210.1021/ma025887t ↗
9. Chem. Rev. · 2004 · 104
10. Mas-Torrent M. · J. Mater. Chem. · 2006 · 16 · 43310.1039/B510121B ↗
11. Noda B. · Chem. Lett. · 2005 · 34 · 39210.1246/cl.2005.392 ↗
12. Katsuhara M. · Synth. Met. · 2005 · 149 · 21910.1016/j.synthmet.2005.01.005 ↗
13. Naraso · J. Am. Chem. Soc. · 2005 · 127 · 1014210.1021/ja051755e ↗
14. Dimitrakopoulos C. D. · IBM J. Res. Dev. · 2001 · 45 · 1110.1147/rd.451.0011 ↗
15. Locklin J. · Chem. Mater. · 2005 · 17 · 336610.1021/cm047851g ↗
16. Curtis M. D. · J. Am. Chem. Soc. · 2004 · 126 · 431810.1021/ja0397916 ↗
17. Halik M. · Adv. Mater. · 2003 · 15 · 91710.1002/adma.200304654 ↗
18. Li Y. · Adv. Mater. · 2005 · 17 · 84910.1002/adma.200401290 ↗
19. Van de Craats A. M. · Adv. Mater. · 2003 · 15 · 49510.1002/adma.200390114 ↗
20. Yamada J. · 200410.1007/978-3-662-10630-3 ↗
21. Mas-Torrent M. · J. Am. Chem. Soc. · 2004 · 126 · 854610.1021/ja048342i ↗
22. Bromley S. T. · J. Am. Chem. Soc. · 2004 · 126 · 654410.1021/ja049762a ↗
23. Mas-Torrent M. · J. Am. Chem. Soc. · 2004 · 126 · 98410.1021/ja0393933 ↗
24. Mas-Torrent M. · Appl. Phys. Lett. · 2005 · 86 · 01211010.1063/1.1848179 ↗
25. Wu P. · Chem. Lett. · 1986 · 44110.1246/cl.1986.441 ↗
26. Inokuchi H. · Chem. Lett. · 1986 · 126310.1246/cl.1986.1263 ↗
27. Burda, L.; Tracz, A.; Pakula, T.; Ulanski, J.; Kryszewski, M.J. Phys.D: Appl. Phys.1983,16, 1737. (b) Ulanski, J.; Tracz, A.; El Shafee, E.; Debrue, G.; Deltour, R.Synth. Met.1990,35, 221. (c) Tracz, A.; El Shafee, E.; Ulanski, J.; Jeszka, J. K.; Kryszewski, M.Synth. Met.1990,37, 175.10.1088/0022-3727/16/9/019 ↗
28. Miskiewicz P. · Synth. Met. · 2003 · 137 · 90510.1016/S0379-6779(02)01023-8 ↗
29. Miskiewicz P. · 2003
30. Pisula W. · Adv. Mater. · 2005 · 17 · 68410.1002/adma.200401171 ↗
31. Rodriguez-Navarro A. · Eur. J. Mineral. · 2000 · 12 · 60910.1127/ejm/12/3/0609 ↗
32. Nitz V. · Phys. Rev. B · 1996 · 54 · 503810.1103/PhysRevB.54.5038 ↗
33. Salditt T. · J. Phys. Condens. Matter · 2005 · 17 · R28710.1088/0953-8984/17/6/R02 ↗
34. Gibaud A. · Phys. Rev. Lett. · 1995 · 74 · 320510.1103/PhysRevLett.74.3205 ↗
35. Linda Chen, X.; Lovinger, A. J.; Bao, Z.; Sapjeta, J.Chem. Mater.2001,13, 134110.1021/cm0008563 ↗
36. Li S. P. · Appl. Phys. Lett. · 2005 · 87 · 06210110.1063/1.2009063 ↗
37. Shi Z. · J. Phys. Chem. · 1988 · 92 · 504410.1021/j100328a042 ↗
38. Newman C. R. · Chem. Mater. · 2004 · 16 · 443610.1021/cm049391x ↗