In-situ observation system of the dynamic process of structual changes during ion irradiation and its application to SiC and TiC crystals
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OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Metal and Thin Film Mechanics · Semiconductor materials and interfaces
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References (7)
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2. Ishino · IEEE Trans. Nucl. Sci. NS-30 · 1983 · 125510.1109/TNS.1983.4332503 ↗
3. Furuno · 1988 · 155–157
4. Hojou · Micron · 1977 · 8 · 151
5. Hojou · J. Nucl. Mater. · 1985 · 133 & 134 · 70910.1016/0022-3115(85)90241-7 ↗
6. Hojou · 1986 · 1301
7. K. Hojou and K. Izui, to be published.