Inferring radiation-induced microstructural evolution in single-crystal niobium through changes in thermal transport
Source abstract
Abstract
Abstract Ion beams enable accelerated radiation exposure experiments, but traditional destructive post-irradiation examination techniques remain time-consuming. Here, measurements of thermal diffusivity are used to monitor microstructural changes in single crystal niobium irradiated with Si3+ ions up to 1.9 dpa (5.1 × 1015 ions/cm2). Changes in thermal transport are correlated to defect generation and clustering through dose-microstructure relationships. These measurements are made using transient grating spectroscopy (TGS), a multi-modal, non-destructive, rapid characterization technique. This work demonstrates that in this low-dose point defect clustering regime, direct measurements of thermal properties are a powerful tool for understanding irradiation-induced microstructure evolution.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Ion-surface interactions and analysis · Fusion materials and technologies · Nuclear Materials and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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