journal article·1980-03

Methods for determining the depth of near-surface defects

Dixon Cleveland, Andrew R. Barron, Anthony N. Mucciardi

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Non-Destructive Testing Techniques · Ultrasonics and Acoustic Wave Propagation · Welding Techniques and Residual Stresses

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (9)

Show source-provided references
1. D. Cleveland, A. R. Barron, and A. N. Mucciardi,Continued Analysis of Digitized Ultrasonic Echo Waveforms Using Adaptive Learning Network Techniques: Phase II-ALN Classifier to Detect and Discriminate Between Near- and Far-Surface Defects in Engine Turbine Disks, Adaptronics, Inc., Final Technical Report to GE-Aircraft Engine Group, Evendale, OH, under Contract No. 200-4S2-14N46536 (January 1979).
2. D. Cleveland, and A. N. Mucciardi, Frequency domain methods for reducing transducer variability,J. Nondestructive Eval. 1(2): to appear (1980).10.1007/BF00566118 ↗
3. D. Cleveland, A. R. Barron, and A. N. Mucciardi, Ultrasonic waveform features that discriminate between two- and three-dimensional reflectors, in preparation.
4. C. M. Elias, and T. J. Moran, A pseudorandom binary noise ultrasonic system,Proc. ARPA/AFML Rev. Progr. Quantitative NDE, AFML-TR-78-205 (January 1979), pp. 511?521.
5. M. H. Loew, R. Shankar, and A. N. Mucciardi, Experiments with echo detection in the presence of noise, using the power cepstrum and a modification,Proc. IEEE Int. Conf. Acoustics, Speech, and Signal Processing, Hartford, CT, (May 1977).10.1109/ICASSP.1977.1170327 ↗
6. R. Shankar and A. N. Mucciardi, Near-surface defect detection, to appear inMaterials Evaluation.
7. R. Shankar, and R. N. McDonaugh, The phase cepstrum and its applications to ultrasonic testing,Proc. 1978 IEEE Int. Conf. Acoustics, Speech, and Signal Processing, Tulsa, OK (April, 1978).
8. J. Tiemann and J. D. Young, Ultrasonic inspection system with high near-surface detectability,Proc. ARPA/AFML Rev. Progr. Quantitative NDE, AFML-TR-78-205 (January 1979), p. 54.
9. B. R. Tittman, O. Buck, and L. Ahlbey, Surface wave scattering from elliptical cracks for failure prediction,Proc. ARPA/AFML Rev. Progr. Quantitative NDE, AFML-TR-78-205 (January 1979), pp. 511?522.