A Backscatter Radiography Simulation Study
Source abstract
Abstract
Backscatter radiography has become a well known inspection technique for the cases where the inspection is to be carried out only for one sided configurations. Compared to the conventional projection radiography, the backscatter radiography has more parameters to be adjusted for a well implemented inspection procedure. The interrogating beam and detector collimation, beam and detector orientation and the distance to the target surface are among those parameters that need to be adjusted. The adjustment of these parameters is not straightforward. A simulation based approach can provide good insight into adjusting the parameters. In this article, we show how simulations can be used for understanding the impact of various parameters. In doing that, we also document how the deterministic methods can prove to be very beneficial since the computations can be done only once and the scattered flux can be computed for various detector configurations without going back to transport computations. Some computational results are provided.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Microwave Imaging and Scattering Analysis · Ultrasonics and Acoustic Wave Propagation · Advanced X-ray and CT Imaging
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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