Spectroscopic Ellipsometry: a Non-destructive Technique for Surface Analysis
Source abstract
Abstract
New spectroscopic ellipsometry techniques are very promising for the non-destructive surface analysis of thin films on metals. Infrared spectroscopic ellipsometry allows the morphological and chemical characterization of these films, and recent results are presented here.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: nanoparticles nucleation surface interactions
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References
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