Preparation and dielectric tunability of bismuth-based pyrochlore dielectric thick films on alumina substrates

Abstract Metal–insulator–metal capacitors structures, employing the cubic pyrochlore Bi 1.5 Zn 1.0 Nb 1.5 O 7 (BZN) thick films, were fabricated by screen-printing techniques on alumina substrates. Chemical compatibility and microstructure between layers was studied by EDS/SEM analysis. The dielectric properties of BZN thick films have been investigated as a function of temperature and frequency. The films exhibited the dielectric constant up to 130, and the dielectric loss less than 0.005 at 1 MHz. The dielectric tunabilities of the films have been compared at different temperature. The BZN thick film showed low tunability of about 1.8% at 10 kHz under 100 kV/cm dc bias voltage in temperature from −150 to 180 °C. The temperature stability of dielectric properties for BZN thick film should be useful for designing temperature stable frequency agile.