journal article·2012-01

A study on the electrical properties of fluorine doped direct-patternable SnO2 thin films

Hyuncheol Kim, Hyung-Ho Park

Publisher page

Abstract

Abstract Direct-patternable fluorine doped SnO2 (FTO) thin films were fabricated by a photochemical solution deposition method. The electrical properties and crystallinity of FTO thin films were slightly enhanced relative to undoped SnO2 films and the improvement of electrical conduction was found to be due to an increase of carrier concentration. Direct-patterning of FTO thin films was performed without using photoresist or dry etching. These results suggest that a micro-patterned system can be simply fabricated at low cost, and the electrical properties of direct-patternable SnO2 films can be improved by fluorine doping.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: ZnO doping and properties · Advanced Sensor and Energy Harvesting Materials · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (13)

Show source-provided references
1. Structural, electrical, and optical properties of transparent conductive In2O3–SnO2 films,10.1116/1.1894421 ↗
2. Doped ZnO thin films as anode materials for organic light-emitting diodes10.1016/S0040-6090(02)00836-2 ↗
3. Current–voltage characteristics of thin-film gas sensor structures based on tin dioxide10.1134/1.1920390 ↗
4. High efficiency photoresist-free lithography of UO3 patterns from amorphous films of uranyl complexes10.1557/JMR.1998.0196 ↗
5. Studies on micro-structural and electrical properties of spray-deposited fluorine-doped tin oxide thin films from low-cost precursor10.1016/j.tsf.2004.09.022 ↗
6. Fluorine doped tin oxide films from spray pyrolysis of stannous fluoride solutions10.1016/0169-4332(95)00224-3 ↗
7. Levin · 1981
8. Optimization of F-doped SnO2 electrodes for organic photovoltaic devices10.1007/s00339-008-4756-z ↗
9. Electron scattering mechanism in indium–tin-oxide thin films prepared at the various process conditions10.1016/j.apsusc.2005.03.203 ↗
10. Light scattering on free electrons in semiconductors in the presence of electron-relaxation processes10.1103/PhysRevB.26.5730 ↗
11. Characterization of tin oxides by X-ray-photoemission spectroscopy10.1103/PhysRevB.46.2460 ↗
12. Chastain · 1992
13. The vapor pressure of fluorine10.1021/ja01318a023 ↗