Structural, thermal and dielectric behavior of Polyaryletherketone (PAEK)/CaCu3Ti4O12 (CCTO) nanocomposite films

Abstract Polyaryletherketone (PAEK)/CaCu3Ti4O12 (CCTO) nanocomposite films with various (0, 1, 5, 10 and 20) weight % CCTO were fabricated via melt-compounding followed by film extrusion process. CCTO nanoceramics (nCCTO) with a crystallite size of about 30–100 nm were prepared from oxalate precursor route. Thickness of the fabricated films was in the range of 50–80 μm, and these films were characterized for their structural, thermal, and dielectric behavior. X-ray diffraction analyses showed the presence of peaks corresponding to both PAEK and CCTO with varying intensities. Fourier transform infrared (FTIR) studies revealed that the chemical structure of PAEK was unaltered by the incorporation of nCCTO. Melting temperature of pure PAEK was about 372 °C, which did not change significantly with the addition of nCCTO. Thermo-gravimetric analysis was carried out to study the thermal stability of these nanocomposites. Frequency independent dielectric behavior was observed in case of all nanocomposite films. Room temperature dielectric permittivity of PAEK (3.3 at 10 kHz) was enhanced with the addition of nCCTO, and for 20 wt% loading a value of 4.5 was achieved. Low values of dielectric loss (0.005–0.009) were obtained for all nanocomposite films at 10 kHz. These nanocomposites can be explored as possible dielectric materials for capacitor applications.