journal article·2025-11

Dielectric breakdown strength of pore-induced alumina substrates

Yuki Nakashima, Kiyoshi Hirao, You Zhou, Tatsuki Ohji, Norimitsu Murayama, Manabu Fukushima

Ceramics International· Volume 51· Issue 28
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Abstract

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OpenAlex topics: Semiconductor materials and devices · Advanced ceramic materials synthesis · Copper Interconnects and Reliability

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