journal article·2025-07

Effects of deposition temperature on microstructure and electrical resistivity of intrinsic CVD-SiC

Jiabao Liu, Zhaofeng Chen, Pan Chai, Qiang Wan

Ceramics International· Volume 51· Issue 18
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Abstract

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OpenAlex topics: Silicon Carbide Semiconductor Technologies · Semiconductor materials and devices · Copper Interconnects and Reliability

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