journal article·2024-01-02

Study of fine patterning lithography for panel level packaging

Hiromi Suda, Douglas Shelton, Ken-Ichiro Mori, Ken-Ichiro Shinoda, Yoshio Goto, Kosuke Urushihara

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Abstract

Heterogeneous integration is evolving to acquire finer resolution and larger devices to leverage the advantages provided by more-than-Moore manufacturing and packaging technologies that can help maximize the efficiency and increase the bandwidth of high performance computing systems. 2.xD integration with redistribution layers and large package sizes is one of solutions that can enable complex heterogeneous integration designs for applications, including artificial intelligence, 5G communication, and autonomous driving. For systems requiring large package sizes, panel level packaging (PLP) can offer efficiency and cost advantages over wafer level packaging. PLP, however, poses unique technical challenges, including the requirement to realize uniform fine patterning across the entire rectangular panel. In this paper, we report on our study of resolution and overlay performance using the panel stepper including an introduction of technology innovations supporting 2.xD heterogeneous integration development.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: 3D IC and TSV technologies · VLSI and FPGA Design Techniques · Electronic Packaging and Soldering Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Canon INC., Utsunomiya, Japan

Canon U.S.A., Inc., San Jose, California, United States

References (5)

Show source-provided references
1. 10.1117/12.91787710.1117/12.917877 ↗
2. Photolithography study for high-density integration technologies
3. 10.1109/ECTC32862.2020.0005710.1109/ECTC32862.2020.00057 ↗
4. 10.1109/ECTC32696.2021.0033110.1109/ECTC32696.2021.00331 ↗
5. 10.1109/ECTC.2019.0002310.1109/ECTC.2019.00023 ↗