Crystal structure, microwave dielectric property and THz time domain spectroscopy of Na5Lu(MoO4)4 ceramics for LTCC applications

The pure Na 5 Lu(MoO 4 ) 4 (NLM) ceramics were prepared by the traditional solid state method and characterized by advanced instruments. According to XRD pattern and Rietveld refinement , NLM ceramic is tetragonal structure with I 4 1 / a space group. The micromorphology of ceramic was measured by scanning electron microscope (SEM). The lattice dynamics information of NLM ceramics were analyzed by Raman spectroscopy . The chemical bond characteristics of ceramics was calculated and analyzed based on the Phillips–van Vechten–Levine theory (P-V-L). Mo-O bonds have higher f i and U , which indicating that they have positive effects on the dielectric properties of NLM ceramics. The optimum dielectric properties ( ε r ∼7.10, Q × f ∼35, 717 GHz, τ f ∼ − 62.23 ppm/°C) of NLM ceramic are exhibited at 600 °C, and the low sintering temperature (less than 960 °C) can be used for LTCC technology. The dielectric behavior of NLM ceramic during the 0.3–1.3 THz band was measured by terahertz time-domain spectroscopy (THz − tds), which shows an excellent application prospect in the future communication.