journal article·2022-04-21

Extreme ultraviolet scanner with high numerical aperture: obscuration and wavefront description

Laurens de Winter, Timur Tudorovskiy, Jan van Schoot, Kars Troost, Erwin Stinstra, Stephen Hsu, Toralf Gruner, Juergen Mueller, Ruediger Mack, Bartosz Bilski, Joerg Zimmermann, Paul Graeupner

Publisher page

Abstract

Background: A unique extreme ultraviolet (EUV-) scanner with a high numerical aperture (NA) of 0.55 was designed to enable printing of resolution lines with 8 nm half-pitch in a single exposure. The introduction of a central obscuration in the optics design reduces the angular load on the multilayer mirrors, enabling a high transmission and throughput. The central obscuration area has been minimized for best imaging, overlay, and transmission. Aim: The wavefront is only available in the non-obscured area. This raises the question of how to describe such a wavefront. Approach: We discuss the choice of fringe-Tatian basis functions to represent the wavefront for an obscured pupil. To make this choice, one needs to balance mathematical correctness while maintaining a simple and intuitive description. Results: We provide a detailed analysis for selecting basis functions that are adequate to describe measured wavefronts on the non-obscured part of the pupil. This statement is supported by imaging simulations. A fast and stable evaluation of the chosen basis functions is presented. An adapted definition of the wavefront root-mean-square deviation for these functions is proposed; it has the advantage of being simple and independent of the number of basis functions used. Conclusions: Because of the benefits of the proposed representation, the community is encouraged to use the same formalism.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advancements in Photolithography Techniques · Adaptive optics and wavefront sensing

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

ASML Netherlands B.V., Veldhoven

ASML-Brion, San Jose, California

Carl Zeiss SMT GmbH, Oberkochen

References

Reference metadata was not supplied for this record.