journal article·2023-12-02Open access

Special Section Guest Editorial: Direct Write Lithography

Stephen Renwick, Laurent Pain

Abstract

The Journal of Micro/Nanopatterning, Materials, and Metrology (JM3) publishes peer-reviewed papers on the core enabling technologies that address the patterning needs of the electronics industry.
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Research context

OpenAlex topics: Nanofabrication and Lithography Techniques · Advancements in Photolithography Techniques

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Affiliations

Nikon Research Corporation of America, Oro Valley, Arizona, United States

Commissariat à l’énergie atomique et aux énergies alternatives, Fontenay-aux-Roses, France

References

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