journal article·2023-06-05

Development of deep ultraviolet optical maskless exposure tool for advanced lithography

Yoji Watanabe, Yuho Kanaya, Yusuke Saito, Toshiaki Sakamoto, Kazuo Masaki, Soichi Owa, Thomas Koo, David Tseng, Conrad Sorensen, Bryant Lin, Michael Tan, Sujuan Li, Stephen Renwick, Noriyuki Hirayanagi, Bausan Yuan

Publisher page

Abstract

Digital scanner (DS), a deep ultraviolet optical maskless exposure tool is being developed. DS uses a micromirror-type spatial light modulator to create the “mask” pattern combined with a solid-state laser with a wavelength of 193 or 248 nm. The exposure concept of DS and advantage of solid-state laser as an exposure light source is described. DS proof-of-concept tool with resolution of half-pitch 80 nm L/S was developed. The exposure results of maskless unique application, such as large area printing and chip ID printing for security purposes, are shown.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advancements in Photolithography Techniques · Industrial Vision Systems and Defect Detection · Surface Roughness and Optical Measurements

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Affiliations

Nikon Corporation, Kumagaya, Saitama, Japan

Nikon Research Corporation of America, Belmont, California, United States

References

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