Preparation and characterization of multilayer anti-reflective coatings via sol-gel process
Source abstract
Abstract
Abstract Single layer and multilayer films consisting of SnO 2 , Ta 2 O 5 , SiO 2 , TiO 2 , indium tin oxide (ITO) and antimony tin oxide (ATO) have been prepared by sol-gel dip coating technique. All of the multilayer films contained a SiO 2 top layer, which was composed of SiO 2 nanoparticles. The other films had polymeric character. Obtained films were characterized by ellipsometry, XRD, AFM and SEM. Light transmittance values of the films were compared. Films other than SiO 2 and Ta 2 O 5 were found to have crystalline structure. Thickness values of the films were in the range of 30–115 nm and roughness values were in 1.2–23 nm range. Single layer porous silica provided 95% light transmittance, whereas ITO-TiO 2 -SiO 2 multilayer film provided a light transmittance of 97.2%.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Optical Coatings and Gratings · Silicone and Siloxane Chemistry · TiO2 Photocatalysis and Solar Cells
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (23)
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