Preparation and characterization of indium-doped tin oxide thin films
Source abstract
Abstract
Highly transparent and semiconducting indium-doped tin oxide films were prepared by spray pyrolysis. These films were characterized by X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy and optical transmission. X-ray diffraction studies have shown the polycrystalline nature of the films. The preferential orientations as well as the electro-optical properties are sensitive to indium doping. The structural, electrical and optical studies carried out on these films reveal their columnar and compact structure.
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Research context
OpenAlex topics: ZnO doping and properties · Gas Sensing Nanomaterials and Sensors · Transition Metal Oxide Nanomaterials
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References (28)
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