High speed and low roughness micromachining of silicon carbide by plasma etching aided femtosecond laser processing
Source abstract
Abstract
Abstract Silicon carbide has a high hardness and corrosion resistance. Accordingly, high rate machining of this material is a big challenge to obtain good surface quality. In this work, plasma etching aided femtosecond laser micromachining was proposed to address this issue. A series of square and circular blind holes for forming SiC pressure sensor diaphragms were obtained by using a 50fs, 800 nm, 1000Hz Ti:Sapphire laser. Using the control variable method, the effects of laser machining power, scan line spacing and scanning rate on surface topography of the structure were investigated. As demonstrated by experimental results, surface roughness of the structure increases with the laser machining power within a certain range. While the scanning rate has negligible effects on surface quality of the structure. The maximum surface roughness after femtosecond laser micromachining is 2.867 μm measured by laser scanning confocal microscope, and this value is reduced to 2.143 μm after inductively coupled plasma etching. In addition, a Raman spectroscopy shows that this composite micromachining method can eliminate accumulation of amorphous carbon on SiC surface caused by the femtosecond laser processing. The reduction of surface roughness and removal of amorphous carbon can effectively decrease probability of crack failure of the sensor diaphragm and increase its deformation capability, thereby ensuring sensitivity of the sensor. The composite micromachining method fully combines the advantages of high efficiency of femtosecond laser machining and high surface quality of plasma etching, making it has high potential to be applied in precision machining of silicon carbide and fabrication of SiC sensors.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Laser Material Processing Techniques · Advanced Surface Polishing Techniques · Diamond and Carbon-based Materials Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (23)
Show source-provided references
1. High-pressure deflection behavior of laser micromachined bulk 6H-SiC MEMS sensor diaphragms10.1016/j.sna.2010.06.018 ↗
2. Fabrication and characterization of a SiC/SiO2/Si mathContainer Loading Mathjax, piezoresistive pressure sensor10.1016/j.proeng.2010.09.183 ↗
3. UV nanosecond laser machining and characterization for SiC MEMS sensor application
4. Bulk micromachining of SiC substrate for MEMS sensor applications10.1016/j.mee.2013.01.046 ↗
5. A silicon carbide capacitive pressure sensor for in-cylinder pressure measurement10.1016/j.sna.2007.09.015 ↗
6. Wieczorek · 2007
7. Okojie · 1996
8. Wet etching of GaN, AlN, and SiC: a review10.1016/j.mser.2004.11.002 ↗
9. Growth mechanism of SiC CVD: surface etching by H2, HAtoms, and HCl10.1021/acs.jpca.7b10800 ↗
10. On the etching mechanisms of SiC thin films in CF4/CH2F2/N2/Ar inductively coupled plasma10.1007/s11090-016-9781-7 ↗
11. High-temperature single-crystal 3C-SiC capacitive pressure sensor10.1109/JSEN.2004.830301 ↗
12. Picosecond pulsed laser ablation and micromachining of 4H-SiC wafers10.1016/j.apsusc.2008.11.071 ↗
13. Effect of different parameters on machining of sic/sic composites via pico-second laser10.1016/j.apsusc.2015.12.089 ↗
14. Structural transformations in femtosecond laser-processed n-type 4H-SiC10.1016/j.apsusc.2016.05.041 ↗
15. High temperature smart-cut soi pressure sensor10.1016/j.sna.2009.03.011 ↗
16. Development of high temperature resistant of 500°C employing silicon carbide (3c-sic) based mems pressure sensor10.1007/s00542-014-2353-y ↗
17. A review of ultrafast laser materials micromachining10.1016/j.optlastec.2012.06.037 ↗
18. Manufacturing of precise sic components by nd:yag laser radiation10.4028/www.scientific.net/SSP.80-81.441 ↗
19. Goldsmith · 1998
20. Mechanical behavior of laser micro-machined bulk 6H–SiC diaphragms10.1016/j.matdes.2010.02.035 ↗
21. Highly sensitive 4H-SiC pressure sensor at cryogenic and elevated temperatures10.1016/j.matdes.2018.07.014 ↗
22. Characterization of electrical properties in SiC crystals by Raman scattering spectroscopy
23. Spatial characterization of doped SiC wafers by Raman spectroscopy10.1063/1.368947 ↗