Correlative Raman imaging and scanning electron microscopy for advanced functional materials characterization
Source abstract
Abstract
Confocal Raman imaging and scanning electron (RISE) microscopy, when combined in a microscope, complement each other and provide the emerging opportunities to clarify morphological, structural, and chemical information of materials at the micron and even nanoscale. Specifically, such advanced RISE microscopy enables the elucidations of one region of interest from a perspective of multiple characterization methods rather than the routine sample-based analysis, representing a major leap in comprehensively characterizing samples. Herein, we summarize the principle, development history, and typical application cases of the state-of-the-art technique, ranging from energy storage, catalysis, and environmental science to other various research fields. A promising future of RISE microscopy is highly expected in physical science, particularly in characterizing advanced functional materials.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Advanced Electron Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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