In-situ Observation of Domain Wall Motion in Electroplated Ni80-Fe20 Thin Film by Lorentz TEM and DPC Imaging

In-situ observations of magnetic domain wall motion in a Ni80-Fe20 thin film electroplated on a Cu film were performed by Lorentz TEM. Detailed magnetization distribution was investigated by differential phase contrast microscopy. The magnetic properties of the coercivity and saturation magnetic flux density were measured to be 6.5 Oe and 1.56 T, respectively. The diffraction ring pattern showed the Ni3Fe FCC structure with nanocrystalline nature (grain size 29 nm) and texture indicating the preferential orientation. We measured the domain width of 1.9 μm and found the fluctuation of magnetization direction coupled with two vortices. With the in-plane and out-of-plane magnetic fields applied, domain wall motions were in-situ observed and discussed.