Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam
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Research context
OpenAlex topics: Carbon Nanotubes in Composites · Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications
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References (7)
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1. Nanotubes as nanoprobes in scanning probe microscopy10.1038/384147a0 ↗
2. Han C-S, Lee H-W, Ryu S-H, Kim S-H, Kwak Y-G. Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis, In: SPIE’s international symposium on microelectronics, MEMS, and nanotechnology, The University of Western Australia (Perth, Australia): The International Society of Optical Engineering. 2003. p. 239–45.10.1117/12.529801 ↗
3. Growth of nanotubes for probe microscopy tips10.1038/19658 ↗
4. Simple and efficient method for carbon nanotube attachment to scanning probes and other substrates10.1063/1.1567049 ↗
5. Straightening suspended single walled carbon nanotubes by ion irradiation10.1021/nl049550b ↗
6. Imaging artefacts in atomic force microscopy with carbon nanotube tips10.1088/0957-4484/16/11/003 ↗
7. Nanomachining carbon nanotubes with ion beams10.1063/1.1756191 ↗