journal article·2012-03Open access

Effects of some factors on the thermal-dissipation characteristics of high-power LED packages

Peng Fei Ji, Cheol-Hee Moon

Journal of Information Display· Volume 13· Issue 1

Abstract

Decreasing the thermal resistance is the critical issue for high-brightness light-emitting diodes. In this paper, the effects of some design factors, such as chip size (24 and 35 mil), substrate material (AlN and high-temperature co-fired ceramic), and die-attach material (Ag epoxy and PbSn solder), on the thermal-dissipation characteristics were investigated. Using the thermal transient method, the temperature sensitivity parameter, R th (thermal resistance), and junction temperature were estimated. The 35-mil chip showed better thermal dissipation, leading to lower thermal resistance and lower junction temperature, owing to its smaller heat source density compared with that of the 24-mil chip. By adopting an AlN substrate and a PbSn solder, which have higher thermal conductivity, the thermal resistance of the 24-mil chip can be decreased and can be made the same as that of the 35-mil chip.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: 3D IC and TSV technologies · Thin-Film Transistor Technologies · Electronic Packaging and Soldering Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (10)

Show source-provided references
1. Meneghini M. · IEEE Trans. Electron Devices · 2010 · 57
2. Fujita, S., Yoshihara, S., Sakamoto, A., Yamamoto, S. and Tanabe, S. Fifth International Conference on Solid State Lighting. Bellingham.
3. Fred Schubert E. · 2003
4. D.G. Todorov and L.G. Kapisazov, ELECTRONICS’2008, Sozopol, Bulgaria, 2008.
5. Yang L. · Thermochim. Acta · 2007 · 455
6. Chhajed S. · J. Appl. Phy. · 2005 · 97
7. Yang L. · IEEE Trans. Device Mater. Reliab. · 2008 · 8
8. Szekely V. · IEEE Trans. Compon. Packag. Technol. · 2002 · 25
9. Holman J. P. · 2010
10. P.E. Shade and L.T. Jenkins, Thermal Characterization Techniques (Books on Demand, Stoughton, USA, 1970).