journal article·2005

In-situ studies of electron field emission of single carbon nanotubes inside the TEM

Chuanhong Jin, Jingyun Wang, Mingshen Wang, Jun Su, Lian-Mao Peng

Carbon· Volume 43· Issue 5
Publisher page

Abstract

Electron field emission characteristics of individual multi-walled carbon nanotubes (MWCNTs) were investigated in situ inside the transmission electron microscope (TEM). For a single MWCNT it was found that while field-emission can hardly occur from the side of the nanotube, a curved nanotube may result in finite side emission and the best emission geometry is the top emission geometry. Current-voltage (I-V) measurements made at different vacuum conditions and voltage sweeps emphasize the importance of the adsorbates on the electron field emission of MWCNTs. For a contaminated MWCNT, although the field emission current was reduced, the stability of its emission was improved. A current of up to several tens of mu A was observed for a single MWCNT, but it was found that long time emission usually results in drastic structure damage that may lead to sudden emission failure. (c) 2004 Elsevier Ltd. All rights reserved.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Carbon Nanotubes in Composites · Advanced Electron Microscopy Techniques and Applications · Nanotechnology research and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (11)

Show source-provided references
1. Unraveling nanotubes: field emission from an atomic wire10.1126/science.269.5230.1550 ↗
2. Carbon nanotube field-emission electron source10.1126/science.270.5239.1179 ↗
3. Field emission from nanotube bundle emitters at low fields10.1063/1.119146 ↗
4. Field emission from carbon nanotubes: perspectives for applications and clues to the emission mechanism10.1007/s003390050998 ↗
5. Current saturation mechanisms in carbon nanotube field emitters10.1063/1.125758 ↗
6. Controlled synthesis and phase transformation of ferrous nanowires inside carbon nanotubes10.1016/S0009-2614(03)00808-X ↗
7. STM and AFM instrumentation combined with transmission electron microscope
8. A scanning tunneling microscope in a side-entry holder for reflection electron microscopy in the philips EM40010.1016/0304-3991(88)90224-0 ↗
9. Field emission energy distribution10.1103/RevModPhys.45.487 ↗
10. Characterization of thin film electron emitters by scanning anode field emission microscopy10.1063/1.1379559 ↗
11. Field emission of individual carbon nanotubes in the scanning electron microscope10.1103/PhysRevLett.89.197602 ↗