journal article·1985-12

Influence of incident beam divergence on the intensity of diffuse streaks

Dhananjai Pandey, S Lele, Lalita Prasad, J P Gauthier

Bulletin of Materials Science· Volume 7· Issue 5
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Diffraction in Crystallography · Optical measurement and interference techniques

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References (5)

Show source-provided references
1. Lele S and Pandey D 1985Mater. Sc. Forum 3 14310.4028/www.scientific.net/MSF.3.143 ↗
2. Pandey D 1981Proc. Indian Natn. Sci. Acad. A47 78
3. Pandey D and Krishna P 1977J. Phys. D10 2057
4. Pandey D, Lele S and Krishna P 1980Proc. R. Soc. London A369 435, 451, 46310.1098/rspa.1980.0009 ↗
5. Wilson A J C 1942Proc. R. Soc. London A180 27710.1098/rspa.1942.0040 ↗