journal article·1996-02

Ellipsometric characterization of Cd1−x Mn x Te thin films in the presence of perturbative fields

Sharat Chandra, L K Malhotra, A C Rastogi

Bulletin of Materials Science· Volume 19· Issue 1
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Abstract

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Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Chalcogenide Semiconductor Thin Films

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References (19)

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