journal article·1986-05

Image analysis system for quantitative metallography

V K Chadda, D G Joshi, S N Murthy, S V Kulgod, C Baburao, D K Bhattacharya, Baldev Raj

Bulletin of Materials Science· Volume 8· Issue 2
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Industrial Vision Systems and Defect Detection · Image Processing Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

Show source-provided references
1. Jenkinson G W 1982 Technical Exchange and Symposium on Image Analysis, University of Iron and Steel, Beijing
2. Pratt W K 1978Digital image processing (New York: John Wiley & Sons)
3. Terrell A C 1978Microscope 26 49