Microstructural features of Cd0·8Zn0·2Te thin films studied by X-ray diffraction and electron microscopy

journal article·1995-02

B Samanta, U Pal, B K Samantaray, T B Ghosh, S L Sharma, A K Chaudhuri

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OpenAlex topics: Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films · Electron and X-Ray Spectroscopy Techniques

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